The FE-SEM is a high-resolution scanning electron microscope which uses electrons to illuminate a sample, instead of visible light used in optical microscope by High-stability Schottky field emission gun. When an electron beam strikes the sample, a variety of signals are generated. The three signals which mostly perform in SEM are secondary electrons, backscattered electrons and X-rays. Secondary electrons (SE) provide fine structure topographical feature of sample surface, backscattered electrons (BE) are used to discriminate areas of different atomic number elements and X-rays are used to identify the composition and measure the number of elements in the sample. The SEM operates in high vacuum so the living samples, liquids and anything that contains liquids must be dried before observing.

             The specification of this model is tungsten filament source, 3.0 nm resolution at HV mode and 4.0 nm resolution at LV mode, x 5 to x 300,000 magnification, SE and BE detector. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.

            Additional EDS is equipped for qualitative and quantitative, mapping and line scan elemental analysis. EDS limitations: no detection of elements below B, X-ray detection limit 1,000 -2,000 ppm (0.1 – 0.2 %wt.) depending on the element and samples must be no fluids.